Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

The Future of EELS

Quantification of the Resolved Phase Change in Reconstructed Electron Exit Waves of Gold [110] in Different Electron Microscopes

Atomic imaging in aberration-corrected HRTEM with application to Al alloys

The superSTEM: An Aberration Corrected Analytical Microscopy Facility

Effects of Detector Black Level in ADF-STEM Imaging

Principles of Phase Reconstruction with Aberration Correction Using Three-Dimensional Fourier Filtering Method

Initial Results from Aberration Correction in STEM

A New Laboratory Designed to Provide an Optimum Environment for Aberration-Corrected Electron Microscopes

Estimation of the Electron Beam Energy Spread for TEM Information Limit

Dynamic Observation of an Atom-Sized Gold Wire by Real-Time Defocus Image Modulation Processing Electron Microscope

New Approach For Ultra-Stable TEM-Column Support Frame

Realization of a Field Emission Gun with Advanced Köhler Illumination

Novel techniques for image process in electron probe microanalysis

Image Simulation of Gold Cluster Detection in TEM and STEM

Deconvolution Process of High-Resolution HAADF STEM Images

High-Resolution HAADF STEM of Inversion Boundaries in Sb2O3-Doped Zinc Oxide

Families of Particle-Like Fractals with Differing Shapes and Boundary Fractal Dimensions

Semi-Automatic Tools to Segment Sem Images of Particles

Pit depth quantification of PM Aluminum Composites using Scanning Electron Microscopy and Image Analysis

Image Analysis in PM Aluminum Composites. Matrix/Reinforcement Characterization

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract