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Local Cross-sectional Profiling of Multilayer Thin Films with an Atomic Force Microscope for Layer Thickness Determination
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- 31 January 2011, pp. 1935-1938
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Observations of Dislocations in Cu/Nb Nanolayer Composites After Deformation
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- 31 January 2011, pp. 1939-1941
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Scanning Tunneling Microscopy and Atomic Force Microscopy Investigation of Organic Tetracyanoquinodimethane Thin Films
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- 31 January 2011, pp. 1942-1945
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Radiation Effects in Glasses Used for Immobilization of High-level Waste and Plutonium Disposition
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- 31 January 2011, pp. 1948-1978
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Unidirectional Partial Melting and Solidification of SmBCO Superconductor
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- 31 January 2011, pp. 1979-1989
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Refinement of Nd-422 Phase Trapped in a Nd1+δBa2−δCu3O7−y Superconducting Matrix
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- 31 January 2011, pp. 1990-2001
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Modeling of Peritectic YBa2Cu3O7−x Growth Using Transparent Organic Analogues
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- 31 January 2011, pp. 2002-2008
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Crystalline Phases and Electronic Structures in Superconducting Bi – Sr – Ca – Cu Oxides
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- 31 January 2011, pp. 2009-2013
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Low Energy Ion Impact-enhanced Growth of Cubic Boron Nitride in a Supersonic Nitrogen/argon Plasma Flow
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- 31 January 2011, pp. 2014-2026
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Quantitative Analysis of Electromigration Damage in Al-based Conductor Lines
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- 31 January 2011, pp. 2027-2037
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Void Nucleation on a Contaminated Patch
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- 31 January 2011, pp. 2038-2042
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Deformation Characteristics of Quasicrystalline Al–Cu–Fe Alloys
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- 31 January 2011, pp. 2043-2047
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Characterization of Low-cycle Fatigue Damage in Inconel 718 by Laser Light Scanning
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- 31 January 2011, pp. 2048-2056
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Hardness and Modulus Properties in Ion-beam-modified Amorphous Carbon: Temperature and Dose Rate Dependences
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- 31 January 2011, pp. 2057-2063
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Contact Area Evolution During an Indentation Process
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- 31 January 2011, pp. 2064-2071
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Formation of Single-crystal CoSi2 Buffer Layers on Si(100) Substrates by High Dose Co Ion Implantation for the Deposition of YBa2Cu3O7−x Thin Films
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- 31 January 2011, pp. 2072-2080
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Void Nucleation in Passivated Interconnect Lines: Effects of Site Geometries, Interfaces, and Interface Flaws
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- 31 January 2011, pp. 2081-2090
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In situ X-ray Investigation of Hydrogen Charging in Thin Film Bimetallic Electrodes
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- 31 January 2011, pp. 2091-2098
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Resistance of Plasma-deposited a-C: H/fluorocarbon Films to Anodic Breakdown in Aqueous Electrolytes
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- 31 January 2011, pp. 2099-2103
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Secondary Phase Formation and Microstructural Development in the Interaction Between SrBi2Ta2O9 Films and Pt/Ti/SiO2/Si Substrates
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- 31 January 2011, pp. 2104-2110
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