Powder Diffraction: Volume 21 -

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 21 - June 2006

Contents

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Denver X-Ray Conference

D072 Application of powder diffraction for solving crystal structures containing light elements—invited
R. V. Shpanchenko
Published online by Cambridge University Press:

20 May 2016, p. 172
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D048 Locating adsorbed hydrogen molecules in Cu2(BTC)4/3 by powder neutron diffraction
S. C. Vogel, J. Rowsell, J. Eckert
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20 May 2016, p. 172
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D030 Structure determination from powder diffraction data of some moisture-sensitive, network coordination compounds
P. S. Whitfield, A. Abouimrane, I. Davidson
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20 May 2016, p. 172
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D019 Simultaneous refinements with complex compositional constraints—example of singular value decomposition to diagnose poor matrix conditioning
P. S. Whitfield, I. Davidson, P. Mercier, Y. Le Page, L. Mitchell, P. Stephens, L. Cranswick, I. Swainson
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20 May 2016, p. 172
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D079 Hypotheses test using Nσ
J. Ihringer
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20 May 2016, p. 172
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F02 Simultaneous pixe and XRF: processing the spectra from the mars exploration rovers—invited
J. L. Campbell, C. L. Mallett, J. M. O'Meara, J. A. Maxwell
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20 May 2016, p. 173
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F21 Standardless eds analysis—the influence of X-ray detector models—invited
B. J. Cross
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20 May 2016, p. 173
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F10 Performance limitations in EDPXRF using sdd's
J. Heckel
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20 May 2016, p. 173
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F22 Quantitative analysis on an electron probe with the nist transition edge sensor microcalorimeter X-ray detector
T. Jach, N. Ritchie, J. Ullom, J. Beall
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20 May 2016, p. 173
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F13 Fundamental parameters analysis of rohs elements in plastics
W. T. Elam, B. Shen, B. Scruggs, J. Nicolosi
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20 May 2016, p. 173
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F26 Evaluation of analytical figures of merit for rapid screening of toxic elements in food via EDXRF
P. Palmer, K. Yamamoto, S. Webber, K. Ferguson, R. Jacobs
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20 May 2016, p. 173
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F27 Application of EDXRF to rapid screening for toxic elements in foods and asian patent medicines
R. Jacobs, P. T. Palmer
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20 May 2016, p. 173
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F49 Simultaneous analysis of nickel alloys and high alloy steels using the fundamental parameter method
Y. Kataoka, E. Furusawa, H. Kohno, T. Arai, A. Martin, H. Inoue, M. Mantler
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20 May 2016, p. 173
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D095 High resolution X-ray diffractometry and reflectometry in modern semiconductor manufacturing—invited
R. J. Matyi
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20 May 2016, p. 174
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D056 Investigation of strain, relaxation degree, interface roughness and porosity of SiGe/Si modfet heterostructures — invited
A. Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito
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20 May 2016, p. 174
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D100 System for spatially resolved HRXRD
V. A. Kogan, A. V. Kharchenko
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20 May 2016, p. 174
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DO33 Kinetics and phase equilibria of the interactions of the Ba2YCu3O6 + x superconductor with CeO2 buffer layer
W. Wong-Ng, Z. Yang, L. P. Cook, I. Levin, Q. Huang, J. Frank
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20 May 2016, p. 174
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F34 Applications of X-ray reflectivity to develop and monitor feol and beol processes for sub-65nm technology nodes
E. Nolot
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20 May 2016, p. 174
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D017 High-energy X-ray methods for studying buried interfaces—invited
H. Reichert
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20 May 2016, p. 175
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D049 High pressure deformation study of zirconium
S. C. Vogel, D. W. Brown, H. Reiche, T. A. Sisneros, H. M. Volz, J. Zhang, Y. Zhao, N. Nishiyama, Y. Wang
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20 May 2016, p. 175
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Page 6 of 10

First
« Prev
3
4
5
6
7
8
9
Next »
Last

Powder Diffraction

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Volume 21 - June 2006

Denver X-Ray Conference

D072 Application of powder diffraction for solving crystal structures containing light elements—invited

D048 Locating adsorbed hydrogen molecules in Cu2(BTC)4/3 by powder neutron diffraction

D030 Structure determination from powder diffraction data of some moisture-sensitive, network coordination compounds

D019 Simultaneous refinements with complex compositional constraints—example of singular value decomposition to diagnose poor matrix conditioning

D079 Hypotheses test using Nσ

F02 Simultaneous pixe and XRF: processing the spectra from the mars exploration rovers—invited

F21 Standardless eds analysis—the influence of X-ray detector models—invited

F10 Performance limitations in EDPXRF using sdd's

F22 Quantitative analysis on an electron probe with the nist transition edge sensor microcalorimeter X-ray detector

F13 Fundamental parameters analysis of rohs elements in plastics

F26 Evaluation of analytical figures of merit for rapid screening of toxic elements in food via EDXRF

F27 Application of EDXRF to rapid screening for toxic elements in foods and asian patent medicines

F49 Simultaneous analysis of nickel alloys and high alloy steels using the fundamental parameter method

D095 High resolution X-ray diffractometry and reflectometry in modern semiconductor manufacturing—invited

D056 Investigation of strain, relaxation degree, interface roughness and porosity of SiGe/Si modfet heterostructures — invited

D100 System for spatially resolved HRXRD

DO33 Kinetics and phase equilibria of the interactions of the Ba2YCu3O6 + x superconductor with CeO2 buffer layer

F34 Applications of X-ray reflectivity to develop and monitor feol and beol processes for sub-65nm technology nodes

D017 High-energy X-ray methods for studying buried interfaces—invited

D049 High pressure deformation study of zirconium

Powder Diffraction

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Volume 21 - June 2006

Denver X-Ray Conference