Denver X-Ray Conference
F01 Micro- and local based XRF analysis in cultural heritage—invited
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- 20 May 2016, p. 183
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F24 CT imaging applied to capillary water absorption in sicilian sedimentary rocks used in cultural heritages
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- 20 May 2016, p. 183
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C3 Probing the defect structure of natural nanoparticles with micrometer-sized synchrotron X-ray beams—invited
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- 20 May 2016, p. 183
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F35 Application of low-power energy-dispersive X-ray fluorescence spectrometers to analysis of soils and other materials of geological origin
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- 20 May 2016, p. 183
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D007 Properties and the general use of the X-ray elastic factors—invited
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- 20 May 2016, p. 184
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D075 4-D XRD for strain in many grains using triangulation
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- 20 May 2016, p. 184
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D032 X-ray stress analysis employing the lattice parameter ellipsoid
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- 20 May 2016, p. 184
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D013 Surface and bulk internal stresses in Li2O-2SiO2 glass-ceramics
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- 20 May 2016, p. 184
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D062 Mechanics of microelectronic structures as revealed by X-ray diffraction—invited
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- 20 May 2016, p. 184
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D058 Determination of local strain field in SOI lines using high resolution X-ray diffraction
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- 20 May 2016, p. 184
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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations
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- 20 May 2016, p. 184
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