Powder Diffraction: Volume 21 -

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 21 - June 2006

Contents

Page 7 of 10

Denver X-Ray Conference

D037 In-situ tensile loading study of grain size effect on deformation mechanism in nickel
A. D. Stoica, X.-L. Wang, C. T. Liu, D. Ma, Y. Ren, J. Almer
Published online by Cambridge University Press:

20 May 2016, p. 175
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D051 Investigation of nano-scale deformation mechanisms in metallic multilayers by in-situ synchrotron X-ray diffraction
C. C. Aydiner, D. W. Brown, S. Vogel, Y. C. Wang, A. Misra, J. Almer
Published online by Cambridge University Press:

20 May 2016, p. 175
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D077 Using high energy X rays and in situ loading to understand crystal stresses in polycrystalline metals
M. Miller, J.-S. Park, A. Kazimirov, P. Revesz, J. Bernier
Published online by Cambridge University Press:

20 May 2016, p. 175
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D083 Depth-resolved strain determination of hydroxyapatite coatings using high energy X-ray diffraction
T. P. Ntsoane, M. Topic, T. Thovhogi, M. Härting, D. Robinson, R. B. Heimann
Published online by Cambridge University Press:

20 May 2016, p. 175
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F53 Tube-based portable XRF meets the challenges of RoHS/WEEE compliance
B. Connors, B. Hubbard-Nelson, R. Koch, D. Sackett, B. Tannian, G. Waksman
Published online by Cambridge University Press:

20 May 2016, p. 176
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F64 Improved beam collimation in portable XRF analyzer for analysis of small electronic components
S. Piorek
Published online by Cambridge University Press:

20 May 2016, p. 176
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F66 Need for new X-ray fluorescence standards
J. B. Sardisco, B. H. Clampitt
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20 May 2016, p. 176
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F69 Certified reference materials: the heart of accurate XRF analysis
D. Geist, B. Britt, P. Dalager
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20 May 2016, p. 176
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F33 Forensics applications of X-ray fluorescence spectroscopy in combination with advanced light source sample discovery
S. Mamedov, J. Goldey, A. Whitley, N. Verzard
Published online by Cambridge University Press:

20 May 2016, p. 176
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F61 Using a monochromatic-excitation EDXRF analyzer to measure trace elements in air particulates
N. Gao, Z. Chen, W. M. Gibson
Published online by Cambridge University Press:

20 May 2016, p. 176
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F56 A review of two U.S. silica in-house XRF analytical routine assessments—invited
M. L. Paige
Published online by Cambridge University Press:

20 May 2016, p. 176
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F59 XRF use in the phosphate industry—invited
T. Holland
Published online by Cambridge University Press:

20 May 2016, p. 176
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F67 Development of a quantitative EDXRF method for determining the concentration of palladium applied to tobacco
J. Lipscomb, M. Chang, T. Danielson, C. Connell, S. Zimmermann
Published online by Cambridge University Press:

20 May 2016, p. 176
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F45 Filter debris analysis by energy dispersive X-ray fluorescence applied to J52 engines
G.R. Humphrey
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20 May 2016, p. 176
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F05 Optimization of a dried residue specimen preparation method for quantifying analytes in plutonium metal using WDXRF
C.G. Worley, L.P. Colletti
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20 May 2016, p. 176
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F50 Speciation of traces by means of X-ray absorption spectroscopy with total reflection X-ray fluorescence acquisition—invited
G. Pepponi
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20 May 2016, p. 177
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F32 Recent developments in trace element- and micro-analysis at the IAEA XRF laboratory—invited
A. Markowicz, D. Wegrzynek, S. Bamford, E. Chinea-Cano
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20 May 2016, p. 177
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F60 Trace element analysis at hasylab—invited
G. Falkenberg
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20 May 2016, p. 177
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F29 Applications of synchrotron X-ray fluorescence microprobe at karlsruhe research center
R. Simon, U. Kerdpin, F. Friedrich, W. Faubel, P. Weidler, R. Nüesch, M. Grosse
Published online by Cambridge University Press:

20 May 2016, p. 177
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F07 Micro-XRF analysis using needle-type collimators
K. Tsuji, A. Matsuda
Published online by Cambridge University Press:

20 May 2016, p. 177
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Page 7 of 10

Powder Diffraction

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Volume 21 - June 2006

Denver X-Ray Conference

D037 In-situ tensile loading study of grain size effect on deformation mechanism in nickel

D051 Investigation of nano-scale deformation mechanisms in metallic multilayers by in-situ synchrotron X-ray diffraction

D077 Using high energy X rays and in situ loading to understand crystal stresses in polycrystalline metals

D083 Depth-resolved strain determination of hydroxyapatite coatings using high energy X-ray diffraction

F53 Tube-based portable XRF meets the challenges of RoHS/WEEE compliance

F64 Improved beam collimation in portable XRF analyzer for analysis of small electronic components

F66 Need for new X-ray fluorescence standards

F69 Certified reference materials: the heart of accurate XRF analysis

F33 Forensics applications of X-ray fluorescence spectroscopy in combination with advanced light source sample discovery

F61 Using a monochromatic-excitation EDXRF analyzer to measure trace elements in air particulates

F56 A review of two U.S. silica in-house XRF analytical routine assessments—invited

F59 XRF use in the phosphate industry—invited

F67 Development of a quantitative EDXRF method for determining the concentration of palladium applied to tobacco

F45 Filter debris analysis by energy dispersive X-ray fluorescence applied to J52 engines

F05 Optimization of a dried residue specimen preparation method for quantifying analytes in plutonium metal using WDXRF

F50 Speciation of traces by means of X-ray absorption spectroscopy with total reflection X-ray fluorescence acquisition—invited

F32 Recent developments in trace element- and micro-analysis at the IAEA XRF laboratory—invited

F60 Trace element analysis at hasylab—invited

F29 Applications of synchrotron X-ray fluorescence microprobe at karlsruhe research center

F07 Micro-XRF analysis using needle-type collimators

Powder Diffraction

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Volume 21 - June 2006

Denver X-Ray Conference