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F22 Quantitative analysis on an electron probe with the nist transition edge sensor microcalorimeter X-ray detector

Published online by Cambridge University Press:  20 May 2016

T. Jach
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
N. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
J. Ullom
Affiliation:
National Institute of Standards and Technology, Boulder, CO
J. Beall
Affiliation:
National Institute of Standards and Technology, Boulder, CO

Abstract

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Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2006

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