Powder Diffraction: Volume 18 - Issue 2

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 18 - Issue 2 - June 2003

Contents

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Denver X-Ray Conference

F49 Characterization Techniques for Miniature Low-Power X-ray Tubes
D. Clark Turner, A. Reyes-Mena, M. Moras, C. Jensen, S. D. Liddiard
Published online by Cambridge University Press:

20 May 2016, p. 171
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D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources
T. Holz, R. Dietsch, D. Weißbach, S. Braun, T. Böttger
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20 May 2016, p. 171
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D009 Retractable Knife-Edge for XRD Combinatorial Screening
B. B. He, F. F. Jin, B. Litteer, U. Preckwinkel, K. L. Smith
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20 May 2016, p. 171
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D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts
Z. Cai, Y. Xiao, Z. Wang
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20 May 2016, p. 171
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D047 A High-Temperature Powder Diffraction Furnace II
M. D. Dolan, S. Zdzieszynski, S. T. Misture
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20 May 2016, p. 171
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D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources
T. Holz, R. Dietsch, D. Weißbach, S. Braun, T. Böttger
Published online by Cambridge University Press:

20 May 2016, p. 171
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D009 Retractable Knife-Edge for XRD Combinatorial Screening
B. B. He, F. F. Jin, B. Litteer, U. Preckwinkel, K. L. Smith
Published online by Cambridge University Press:

20 May 2016, p. 171
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D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts
Z. Cai, Y. Xiao, Z. Wang
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20 May 2016, p. 171
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D047 A High-Temperature Powder Diffraction Furnace II
M. D. Dolan, S. Zdzieszynski, S. T. Misture
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20 May 2016, p. 171
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D080 X-ray Diffraction Metrology Tool for Microstructure Control on 300mm Wafers for Silicon Based Semiconductors
K. J. Kozaczek, P. R. Moran, D. S. Kurtz, R. I. Martin, L. Y. Huang, A. Stratilatov
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20 May 2016, p. 172
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D120 Structure- Property Relationships of Superconducting and Heavy Fermion Intermetallics — Invited
J. Chan
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20 May 2016, p. 172
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D045 Residual Strain Determination by Rietveld Refinement of TOF Neutron-Diffraction Measurements on Deformed Uranium
D. Balzar, G. Stefanic, S. Vogel, D. Brown, M. Bourke, B. Clausen, N. C. Popa
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20 May 2016, p. 172
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D068 Three-Dimensional X-ray Diffraction Microscopy of Grain Boundaries
W. Liu, G. E. Ice, W. Yang, J. Z. Tischler, B. C. Larson
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20 May 2016, p. 172
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D031 Fast X-ray Mapping of Large Area Samples
G. Vittiglio, P. Klinger, J. Heckel, D. Wissman
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20 May 2016, p. 172
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D095 Towards Synchrotron-Quality X-ray Diffraction Data with a Laboratory Instrument
M. J. Fransen
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20 May 2016, p. 172
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F50 X-ray Coincidence Spectrometry for Quantitative Determination of Bone Lead Measurement
W. Guo, R. P. Gardner
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20 May 2016, p. 172
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D110 Combining Multiple Observations for Powder Diffraction Crystallography — Invited
B. H. Toby
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20 May 2016, p. 172
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D108 Smart Crystallographic Imaging for Chemical Engineering by MEM/Rietveld Method — Invited
M. Takata, M. Sakata
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20 May 2016, p. 172
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D007 Solving Neighboring Element Problems in Type-I Clathrates Using Resonant Diffraction: Successes and Problems — Invited
A. P. Wilkinson, Y. Zhang, P. L. Lee, G. S. Nolas
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20 May 2016, p. 172
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D069 Revealing Structural Change by the Temperature Dependence of Atomic Displacement Parameters — Invited
B. C. Chakoumakos
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20 May 2016, p. 172
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Page 2 of 8

First
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2
3
4
5
6
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Last

Powder Diffraction

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Volume 18 - Issue 2 - June 2003

Denver X-Ray Conference

F49 Characterization Techniques for Miniature Low-Power X-ray Tubes

D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources

D009 Retractable Knife-Edge for XRD Combinatorial Screening

D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts

D047 A High-Temperature Powder Diffraction Furnace II

D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources

D009 Retractable Knife-Edge for XRD Combinatorial Screening

D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts

D047 A High-Temperature Powder Diffraction Furnace II

D080 X-ray Diffraction Metrology Tool for Microstructure Control on 300mm Wafers for Silicon Based Semiconductors

D120 Structure- Property Relationships of Superconducting and Heavy Fermion Intermetallics — Invited

D045 Residual Strain Determination by Rietveld Refinement of TOF Neutron-Diffraction Measurements on Deformed Uranium

D068 Three-Dimensional X-ray Diffraction Microscopy of Grain Boundaries

D031 Fast X-ray Mapping of Large Area Samples

D095 Towards Synchrotron-Quality X-ray Diffraction Data with a Laboratory Instrument

F50 X-ray Coincidence Spectrometry for Quantitative Determination of Bone Lead Measurement

D110 Combining Multiple Observations for Powder Diffraction Crystallography — Invited

D108 Smart Crystallographic Imaging for Chemical Engineering by MEM/Rietveld Method — Invited

D007 Solving Neighboring Element Problems in Type-I Clathrates Using Resonant Diffraction: Successes and Problems — Invited

D069 Revealing Structural Change by the Temperature Dependence of Atomic Displacement Parameters — Invited

Powder Diffraction

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Volume 18 - Issue 2 - June 2003

Denver X-Ray Conference