Denver X-Ray Conference
C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature
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- 20 May 2016, p. 175
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D043 Phase Identification and Sequence Characterization in Ni-Si Thin Films at Low Temperature
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- 20 May 2016, p. 175
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D013 The Use of X-ray Scattering for Medical Diagnosis
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- 20 May 2016, p. 175
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C13 1- and 2-Dimensional Detection Systems and the Problem of Sample Fluorescence in X-ray Diffractometry
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- 20 May 2016, p. 175
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D111 A New “Vortex” Detector System for X-ray Powder Diffractometry
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- 20 May 2016, p. 175
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New Detector Technologies for X-ray Diffraction — Invited
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- 20 May 2016, p. 175
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D071 Coherent X-ray Scattering on Magnetic Nanostructures — Invited
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- 20 May 2016, p. 175
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D017 Texture and Microstructure Analysis with High-Energy Synchrotron Radiation — Invited
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- 20 May 2016, p. 175
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D035 Depth Resolved Strain Analysis of Lateral Nonostructures Produced by Focused GA ION Implantation in GAAS
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- 20 May 2016, p. 175
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D107 Measurement of Strain Fields Around Domains in BaTiO3 Using X-ray Microdiffraction
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- 20 May 2016, p. 175
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D062 Fatigue Crack Study Using X-ray Phase Contrast and Multiple Angle Stereometry Methods
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- 20 May 2016, p. 175
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D060 Synchrotron X-ray Phase Radiography and Absorption Micro-CT of Regenerating Newt Limbs
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- 20 May 2016, p. 176
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C07 Synchrotron Applications in Archaeometallurgy: Analysis of High Zinc Brass Astrolabes
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- 20 May 2016, p. 176
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D037 In Situ Measurement of Growth Stress in Alumina Scale — Invited
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- 20 May 2016, p. 176
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D075 Precipitation Kinetics and Deformation Behavior of TIAL-W Alloys at Elevated Temperatures — Invited
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- 20 May 2016, p. 176
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D051 Shock-Induced Deformation of Tungsten Powder
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- 20 May 2016, p. 176
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D053 Relaxation of Residual Stress in Shot Peened Ti-6A1-4V Due to Fretting Fatigue
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- 20 May 2016, p. 176
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D099 Powder Diffraction Pattern of Oriented Magnetic Particles Induced by Magnetic Field
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- 20 May 2016, p. 176
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D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction
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- 20 May 2016, p. 176
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D082 Residual Stresses in Thin TaNx/Ta Bilayers: Origin and Evolution
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- 20 May 2016, p. 176
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