Powder Diffraction: Volume 18 - Issue 2

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 18 - Issue 2 - June 2003

Contents

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D084 A New and Efficient Method to Determine Strain/Stress Depth Profiles from Diffraction Experiments
H. Wern, Ch. Klein
Published online by Cambridge University Press:

20 May 2016, p. 178
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C09 Development of a New Positron Lifetime Spectroscopy Technique for Stress and Defect Characterization in Thick Materials
F. A. Selim, D. P. Wells, J. F. Harmon, J. Kwofie
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20 May 2016, p. 179
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D133 X-ray Diffraction at IBM - Invited
C. C. Goldsmith, I. C. Noyan
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20 May 2016, p. 179
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D132 Upgrades of the X-ray and Neutron Diffraction Residual Stress Mapping Facilities at ORNL
C. R. Hubbard, T. R. Watkins, S. Spooner, S. Craig, M. C. Wright
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20 May 2016, p. 179
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D126 XRD for Industry: Selected Examples from a Small Private Laboratory - Invited
H. E. Goebel
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20 May 2016, p. 179
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D072 X-ray Diffraction at Dupont Central Research and Development - Invited
T. G. Amos, M. K. Crawford, W. E. Guise, Jr.
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20 May 2016, p. 179
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D024 X-ray Diffraction and More at GE Global Research Center - Invited
Y. Gao
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20 May 2016, p. 179
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D059 Rocking Curve Analysis of Zinc Oxide Thin Films - Invited
G. R. Kowach
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20 May 2016, p. 179
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D115 Materials Characterization Using a Novel Simultaneous Near Infrared/X-ray Diffraction Instrument
T. Blanton, C. Barnes, J. Putrelo, A. Yeboah, S. Switalski
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20 May 2016, p. 179
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D131 Texture Measurements on Long-Lengths of High Temperature Superconductors
J. L. Reeves, V. Selvamanickam, H. Huang, J. Burdett, R. L. Snyder
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20 May 2016, p. 179
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D014 A Comparison of New and Traditional Routes for Prosthetic Coating Fabrication
K. D. Rogers, S. E. Etok, R. Scott
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20 May 2016, p. 179
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F03 Quantitative Analysis by X-ray Induced Total Electron Yield (TEY) Compared to XRFA — Invited
H. Ebel
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20 May 2016, p. 180
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D050 The Use of XRD Patterns to Evaluate the Compressive Strength of Stabilized Aggregates
N. N. Khoury, M. Zaman, J. G. Laguros
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20 May 2016, p. 180
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Considerations for Optimizing Precision and Accuracy of Multilayer Thin Film Measurements — Invited
A. Wittkopp
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20 May 2016, p. 180
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F05 Standardless FP Analysis of Thin Films and Multiple Layer Coatings
W. T. Elam, R. B. Shen, B. Scruggs, J. Nicolosi
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20 May 2016, p. 180
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F25 Improvements in XRF Specimen Preparation Using the Dried Residue Method: Gallium in Plutonium
C. G. Worley
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20 May 2016, p. 180
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F37 Half Absorbtion Peak - A Spectral Artifact
D. Kenning
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20 May 2016, p. 180
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Process and Quality Control in the Cement Industry Using X-ray Instruments: Challenges and Solutions — Invited
J. Hook
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20 May 2016, p. 180
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D089 Advances in Quantitative XRD Analysis for Clinker, Cement (CEM I, CEM II, CEM III) and Cementitious Additions — Invited
G. Walenta, T. Füllmann
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20 May 2016, p. 180
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F48 Non-Routine Analysis in Cement Industry: Environmental Control, Alternative Fuels and Other Central Lab Applications Using Standard-Less Analysis Programs — Invited
A. Buman, R. Yellepeddi
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20 May 2016, p. 180
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Page 6 of 8

First
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2
3
4
5
6
7
8
Next »
Last

Powder Diffraction

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Volume 18 - Issue 2 - June 2003

Denver X-Ray Conference

D084 A New and Efficient Method to Determine Strain/Stress Depth Profiles from Diffraction Experiments

C09 Development of a New Positron Lifetime Spectroscopy Technique for Stress and Defect Characterization in Thick Materials

D133 X-ray Diffraction at IBM - Invited

D132 Upgrades of the X-ray and Neutron Diffraction Residual Stress Mapping Facilities at ORNL

D126 XRD for Industry: Selected Examples from a Small Private Laboratory - Invited

D072 X-ray Diffraction at Dupont Central Research and Development - Invited

D024 X-ray Diffraction and More at GE Global Research Center - Invited

D059 Rocking Curve Analysis of Zinc Oxide Thin Films - Invited

D115 Materials Characterization Using a Novel Simultaneous Near Infrared/X-ray Diffraction Instrument

D131 Texture Measurements on Long-Lengths of High Temperature Superconductors

D014 A Comparison of New and Traditional Routes for Prosthetic Coating Fabrication

F03 Quantitative Analysis by X-ray Induced Total Electron Yield (TEY) Compared to XRFA — Invited

D050 The Use of XRD Patterns to Evaluate the Compressive Strength of Stabilized Aggregates

Considerations for Optimizing Precision and Accuracy of Multilayer Thin Film Measurements — Invited

F05 Standardless FP Analysis of Thin Films and Multiple Layer Coatings

F25 Improvements in XRF Specimen Preparation Using the Dried Residue Method: Gallium in Plutonium

F37 Half Absorbtion Peak - A Spectral Artifact

Process and Quality Control in the Cement Industry Using X-ray Instruments: Challenges and Solutions — Invited

D089 Advances in Quantitative XRD Analysis for Clinker, Cement (CEM I, CEM II, CEM III) and Cementitious Additions — Invited

F48 Non-Routine Analysis in Cement Industry: Environmental Control, Alternative Fuels and Other Central Lab Applications Using Standard-Less Analysis Programs — Invited

Powder Diffraction

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Volume 18 - Issue 2 - June 2003

Denver X-Ray Conference