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Volume 26 - December 2020

Contents

Page 34 of 69

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

  • Data Processing Using Python in DigitalMicrograph

  • Benjamin Miller, Stephen Mick
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1172-1174
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  • Quantitative Image Format for Electron Microscopy

  • Grigore Moldovan, Michael Zabel
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1176-1178
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  • Experimental data, simulation, data analysis and visualisation require image file formats that are open source and able to contain and manage quantitative data. Quantification techniques bring the new challenge of managing image calibration parameters and formulas in an open and efficient format, compatible with routine microscopy workflows. A practical approach to quantitative image format is presented and discussed here, relying on open and extensible file formats - Tagged Image File (TIF) and Extensible Metadata Platform (XMP).

  • Offline Secondary Electron Counting and Conditional Re-illumination in SEM

  • Akshay Agarwal, John Simonaitis, Vivek Goyal, Karl Berggren
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1182-1184
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  • A New Energy-filtering EBSD/TKD Direct Detector

  • Benjamin Bammes, Robert Bilhorn
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1186-1187
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Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

  • A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films

  • Aubrey Penn, Sanaz Koohfar, Divine Kumah, James LeBeau
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1192-1193
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  • Fe-rich Phase Separation in Doped BaTiO3 as Revealed by STEM-EDS

  • Bethany Hudak, Peter Finkel, Dhiren Pradhan, Ronald Cohen, Rhonda Stroud
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1198-1200
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  • Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization

  • Nicolas Dumaresq, Nicolas Brodusch, Raynald Gauvin
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1206-1208
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  • Measuring the Thickness of 2D Materials Using EDS

  • Samuel Marks, Philippe Pinard, Simon Burgess, Jo Bithell, Richard Beanland
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1212-1214
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  • Analysis of the Dose-Limited Spatial Resolution in Transmission Electron Microscopy

  • Eduardo Ortega, Niels de Jonge
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1216-1217
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  • Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?

  • Nicolas Brodusch, Raynald Gauvin
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1218-1219
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  • High Resolution Imaging of Dislocations Using Weak Beam Dark Field STEM

  • Jiashi Miao
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1220-1222
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  • Preparation of TEM Samples from Specific Orientations Using FIB-SEM

  • Misumi Kadoi, Ichiro Ohnishi, Masateru Shibata, Natasha Erdman
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1224-1225
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  • Nanoparticle Temperature Measurements for MEMS Heater Calibration

  • Matthew Mecklenburg, B. C. Regan, William Hubbard
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1226-1227
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Page 34 of 69