Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

In situ TEM at the Extremes - Multi-beam

Simulation Analysis of Atomic Scale Optical Imaging by Combing Photoexcitation and Electron Microscopy

Femtosecond TEM: Imaging Nanoscale Materials Dynamics at Temporal Extremes

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Novel Approaches for Electron Tomography to Investigate the Structure and Stability of Nanomaterials in 3 Dimensions.

Polarization in Ferroelectric BiFeO3 Imaged in 3D Using Four-dimensional Scanning Transmission Electron Microscopy

Quantitative 3D Characterization of Novel Polymer-nanocrystal Hybrid Catalysts by Electron Tomography

Three Dimensional Structure of Grain Boundaries in Nanometals

Approaching Operando Imaging of Functional Materials

Charge Carriers in Dynamic Ferroelectric Domain Walls

Electron Correlation Microscopy Measurements of Metallic Glass Surface Dynamics

Microreactor for Clean and Controlled In-situ SEM Imaging of CVD Processes

An Atomic Level Study of Local Strain Fields on Multiple Low-index Ceria (CeO2) Nanoparticle Surfaces

Enabling Kinetically-unfavorable Phase Transformation Mechanisms with Plasmonics

TV-rate Atomic-resolution STEM Imaging

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Electrochemistry in an MeV UED System: The Structural Dynamics of In Situ Lithium-intercalated WTe2

Probing the Surface Photovoltage Effect by Imaging Photo-assisted Secondary Electron Emission

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Efficient Skeleton Editing in a VR Environment Facilitates Accurate Modeling of Highly Branched Mitochondria.

Feature Parameter Design Using Cross-sectional SEM for Machine Learning-based Optimization in Plasma Etching

Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection

cloudEMAPS: A Cloud Computing Environment for Electron Microscopy Application Simulations

How the Observation in a New Custom Basis Based on Orbital Angular Momentum Space Could Improve Our Dose Effective Reconstruction of the Protein Structure.

Laboratory Scale Photogrammetry: Micro- and Macroscopic 3D Surface Imaging

Microscopy and Microanalysis

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Volume 26 - December 2020

In situ TEM at the Extremes - Multi-beam

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems