Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-27T00:35:33.036Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoparticle Temperature Measurements for MEMS Heater Calibration

Published online by Cambridge University Press:  30 July 2020

Matthew Mecklenburg ,
B. C. Regan  and
William Hubbard
Matthew Mecklenburg
Affiliation:
University of Southern California, Los Angeles, California, United States
B. C. Regan
Affiliation:
UCLA Department of Physics & Astronomy, Los Angeles, California, United States
William Hubbard
Affiliation:
NanoElectronic Imaging, Inc., Los Angeles, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1226 - 1227
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Mecklenburg, M et al. , Science 347 (2015 ), p. 629–632.10.1126/science.aaa2433CrossRefGoogle Scholar
Yan, X et al. , Microscopy and Microanalysis 25 (S2) (2019), p. 622–623.10.1017/S1431927619003842CrossRefGoogle Scholar
Lagos, M et al. , Nano Letters 18 (2018 ), p. 4556–4563.10.1021/acs.nanolett.8b01791CrossRefGoogle Scholar
Idrobo, J C et al. , Physical Review Letters 120 (2018), p. 095901.10.1103/PhysRevLett.120.095901CrossRefGoogle Scholar
Zhu, M et al. , Microscopy and Microanalysis 25 (S2) (2019), p. 1642–1643.10.1017/S1431927619008948CrossRefGoogle Scholar
Wehmeyer, G et al. , Applied Physics Letters 113 (2018), p. 253101.10.1063/1.5066111CrossRefGoogle Scholar
This material is based upon work supported by the Defense Microelectronics Activity under Contract No. HQ072720P0004.Google Scholar