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Towards Automated Electron Microscopy Image Segmentation for Nanoparticles of Complex Shape by Convolutional Neural Networks

Published online by Cambridge University Press:  30 July 2020

Bastian Rühle
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Berlin, Berlin, Germany
Vasile-Dan Hodoroaba
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Berlin, Berlin, Germany

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Copyright
Copyright © Microscopy Society of America 2020

References

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This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union's Horizon 2020 research and innovation Programme.Google Scholar