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Preparation of TEM Samples from Specific Orientations Using FIB-SEM

Published online by Cambridge University Press:  30 July 2020

Misumi Kadoi ,
Ichiro Ohnishi ,
Masateru Shibata  and
Natasha Erdman
Misumi Kadoi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Ichiro Ohnishi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Masateru Shibata
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Natasha Erdman
Affiliation:
JEOL USA Inc., Peabody, Massachusetts, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1224 - 1225
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Copyright
Copyright © Microscopy Society of America 2020

References

Ohnishi, I.. et al. (2019) 82nd Annual Meeting of The Meteoritical Society 2019 (LPI Contrib. No. 2157) 6146.pdfGoogle Scholar