Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-27T00:46:39.170Z Has data issue: false hasContentIssue false
  • English
  • Français

Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?

Published online by Cambridge University Press:  30 July 2020

Nicolas Brodusch  and
Raynald Gauvin
Nicolas Brodusch
Affiliation:
McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1218 - 1219
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Egerton, R.F., Li, P., Malac, M., Radiation damage in the TEM and SEM, Micron, 35 (2004) 399–409.10.1016/j.micron.2004.02.003CrossRefGoogle ScholarPubMed
Kaiser, U., Biskupek, J., Meyer, J.C., Leschner, J., Lechner, L., Rose, H., Stöger-Pollach, M., Khlobystov, A.N., Hartel, P., Müller, H., others, Transmission electron microscopy at 20kV for imaging and spectroscopy, Ultramicroscopy, 111 (2011) 1239–1246.10.1016/j.ultramic.2011.03.012CrossRefGoogle Scholar
Konno, M., Ogashiwa, T., Sunaoshi, T., Orai, Y., Sato, M., Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope, Ultramicroscopy, 145 (2014) 28–35.10.1016/j.ultramic.2013.09.001CrossRefGoogle ScholarPubMed
Sunaoshi, T., Kaji, K., Orai, Y., Schamp, C.T., Voelkl, E., STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ; ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support, Microscopy and Microanalysis, 22 (2016) 604–605.10.1017/S1431927616003871CrossRefGoogle Scholar