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Measuring the Thickness of 2D Materials Using EDS

Published online by Cambridge University Press:  30 July 2020

Samuel Marks ,
Philippe Pinard ,
Simon Burgess ,
Jo Bithell  and
Richard Beanland
Samuel Marks
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Jo Bithell
Affiliation:
University of Warwick, Coventry, England, United Kingdom
Richard Beanland
Affiliation:
University of Warwick, Coventry, England, United Kingdom

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1212 - 1214
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Copyright
Copyright © Microscopy Society of America 2020

References

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