FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Atomic Electron Tomography: Past, Present and Future
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- 30 July 2020, pp. 652-654
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Higher-order Structure of Human Chromosomes Observed by Electron Tomography and Electron Diffraction
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- 30 July 2020, pp. 656-659
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Optimization of EDX Tomography Acquisition Geometry for Electronic Device Characterization
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- 30 July 2020, pp. 660-662
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Artificial Intelligence Enabled Information Inpainting and Artifact Removal for Electron Tomography
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- 30 July 2020, pp. 664-665
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Approaching Operando Imaging of Functional Materials
Solid State Dynamics Visualized by Environmental EM
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- 30 July 2020, pp. 666-667
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The Effect of Orientation on Cu2O Reduction Under Methanol Observed by in Situ ETEM
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- 30 July 2020, pp. 668-669
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Reduction and Carburization of Iron Oxides for Fischer-Tropsch Synthesis
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- 30 July 2020, pp. 670-671
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Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes
Development and Application of Ultrafast Transmission Electron Microscope Based on Schottky Field Emission
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- 30 July 2020, pp. 672-674
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Relativistic Ultrafast Electron Diffraction of Nanomaterials
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- 30 July 2020, pp. 676-677
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Coherent Phase Control of Ultrashort Electron Pulses by Traveling Optical Waves and Whispering-gallery Modes
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- 30 July 2020, pp. 678-680
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DIY: Microscopy-Inspired Mkrspace 3D Printing
Sculpting Science: Inspired Artwork from the Microscopic World
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- 30 July 2020, p. 682
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Applications of 3D Printing in Microscopy Research
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- 30 July 2020, p. 684
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3D Printed Microscope Optomechanical Tools
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- 30 July 2020, pp. 686-688
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Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Learning Biology Through Puzzle-solving: Unbiased Automatic Understanding of Microscopy Images with Self-supervised Learning
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- 30 July 2020, pp. 690-692
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AI-based Brain Image Segmentation Using Synthesized Data
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- 30 July 2020, pp. 694-697
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Deep Learning-based Automated Measurement Method for Cross-sectional SEM Images in Semiconductor Devices
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- 30 July 2020, pp. 698-700
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Robust Deep-learning Based Autofocus Score Prediction for Scanning Electron Microscope
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- 30 July 2020, pp. 702-705
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Quantitative Prediction of Properties of Organic Molecules from ELNES via Artificial Neural Network
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- 30 July 2020, pp. 706-708
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Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Finding Meaning in 4D STEM: Strategies for Extracting Targeted Specimen Information
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- 30 July 2020, p. 710
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Recording 4D-STEM Datasets at a Range of Beam Tilts Simultaneously with Multi-Beam Electron Diffraction
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- 30 July 2020, pp. 712-713
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