Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-27T01:33:30.188Z Has data issue: false hasContentIssue false

Higher-order Structure of Human Chromosomes Observed by Electron Tomography and Electron Diffraction

Published online by Cambridge University Press:  30 July 2020

Misa Hayashida
Affiliation:
National Research Council Canada, Edmonton, Alberta, Canada
Rinyaporn Phengchat
Affiliation:
Kobe University, Kobe, Hyogo, Japan
Darren Homeniuk
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Marek Malac
Affiliation:
NRC-NANO & Physics, U of Alberta, Edmonton, Alberta, Canada
Ken Harada
Affiliation:
RIKEN, Hatoyama, Saitama, Japan
Tetsuya Akashi
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Nobuko Ohmido
Affiliation:
Kobe University, Kobe, Hyogo, Japan
Kiichi Fukui
Affiliation:
Osaka University, Suita, Osaka, Japan

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Copyright
Copyright © Microscopy Society of America 2020

References

Ushiki, T., Hoshi, O., Iwai, K.I., Kimura, E., Shigeno, M., Archives of Histology and Cytology, 65 (2002) 377-390.10.1679/aohc.65.377CrossRefGoogle Scholar
Maeshima, K., Eltsov, M., J Biochem, 143 (2008) 145-153.10.1093/jb/mvm214CrossRefGoogle Scholar
Maeshima, K., Hihara, S., Takata, H., 75 (2010) 439-444.Google Scholar
Welton, T., Chemical Reviews, 99 (1999) 2071-2083.10.1021/cr980032tCrossRefGoogle Scholar
Kuwabata, S., Kongkanand, A., Oyamatsu, D., Torimoto, T., Chemistry Letters, 35 (2006) 600-601.10.1246/cl.2006.600CrossRefGoogle Scholar
Phengchat, R., Hayashida, M., Ohmido, N., Homeniuk, D., Fukui, K., Micron, 126 (2019) 102736.Google Scholar
Ou, H.D., Phan, S., Deerinck, T.J., Thor, A., Ellisman, M.H., O'Shea, C.C., Science, 357 (2017).10.1126/science.aag0025CrossRefGoogle Scholar
Dwiranti, A., Lin, L., Mochizuki, E., Kuwabata, S., Takaoka, A., Uchiyama, S., Fukui, K., Microsc Res Tech, 75 (2012) 1113-1118.10.1002/jemt.22038CrossRefGoogle Scholar
Tsuneta, R., Kashima, H., Iwane, T., Harada, K., Koguchi, M., Microscopy (Oxf), 63 (2014) 469-473.10.1093/jmicro/dfu030CrossRefGoogle Scholar
Yaguchi, T., Konno, M., Kamino, T., Watanabe, M., Ultramicroscopy, 108 (2008) 1603-1615.10.1016/j.ultramic.2008.06.003CrossRefGoogle Scholar
Poonperm, R., Takata, H., Hamano, T., Matsuda, A., Uchiyama, S., Hiraoka, Y., Fukui, K., Sci Rep, 5 (2015) 11916.10.1038/srep11916CrossRefGoogle Scholar