Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Connecting Structural Heterogeneity to Properties of Disordered Materials
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- 30 July 2020, pp. 714-716
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Quantitative Analysis of Correlated Atomic Displacements via Diffuse Electron Scattering
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- 30 July 2020, pp. 718-720
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Towards Automated Classification of Complex 4D-STEM Datasets
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- 30 July 2020, pp. 722-723
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Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences
Overcoming Practical Limitations to Probe Electronic Structure in Novel Quantum Materials
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- 30 July 2020, pp. 724-727
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EELS Analysis of Ce Valence State of SiO2 Supported CeO2 Nanoparticles, CeOx Nanoclusters and Ce Single Atoms
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- 30 July 2020, pp. 728-730
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Direct Correlation of Grain Boundary Defect Chemistry with Anion Conductivity in Oxide Ceramics Using Direct Detection Electron Energy-Loss Spectroscopy
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- 30 July 2020, pp. 732-733
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Exploiting Electron Beam Interactions with Ultralow Energy Excitations for Nanoscale Analysis of Complex Optical and Biological Systems
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- 30 July 2020, pp. 734-736
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Atomic-scale Identification of High-temperature Superconductivity at La2CuO4 Interfaces
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- 30 July 2020, pp. 738-739
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Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Electron Diffraction as a Tool for Hydrogen Atom Localization and Absolute Structure Determination of Nanocrystals Containing Organic Molecules
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- 30 July 2020, pp. 740-742
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Identification of Structure and Chemical Occupancy of Emerging Complex Compounds via Analytical Electron Microscopy
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- 30 July 2020, pp. 744-746
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Determining Atomic Structures from Digitally Defined Regions of Nanocrystals
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- 30 July 2020, pp. 748-749
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3D Electron Diffraction for Structure Analysis of Challenging Inorganic Materials
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- 30 July 2020, pp. 750-751
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Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
K-ratio Measurements by WDS and EDS for Instrument Maintenance, Calibration, and Accurate Quantification
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- 30 July 2020, pp. 752-754
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Zinc Sulphide Ore Formation – a Cathodoluminescence and X-ray Examination
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- 30 July 2020, pp. 756-758
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Quantitative EPMA Compositional Mapping and Cluster Analysis Applied to Meteorites
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- 30 July 2020, pp. 760-762
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Development of SEM Equipped with Superconductor X-ray Detector Toward Chemical State Nanoimaging for CFRP/adhesive Boundary
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- 30 July 2020, pp. 764-766
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Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD)
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- 30 July 2020, pp. 768-771
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Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis
Microscopy-based Multi-technique, Multi-scale Characterization of Polymer Electrolyte Membrane Devices
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- 30 July 2020, pp. 772-774
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Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy II - Detection and Subtlety
Nanomaterials in Operando Conditions
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- 30 July 2020, p. 776
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Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Featured Multitechnique Methods and Beamline Analysis
Applications of Full-field Transmission X-ray Nanotomography and X-ray Nanospectroscopy at Stanford Synchrotron Radiation Lightsource
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- 30 July 2020, pp. 778-780
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