Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Formation of Misfit Layered PbS Within Molybdenite

Solving Structures of Nano-precipitates in Minerals Using TEM Imaging and Single-crystal XRD Diffraction Methods

Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior

Discovery of New Minerals of Luogufengite and Valleyite Using Synchrotron X-ray Diffraction and Transmission Electron Microscopy

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

BadgerFilm: An Open Source Thin Film Analysis Program

Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework

Standardless Quantitative EPMA of Microparticles with Irregular Shapes

A Modified Mean Atomic Number Background Correction Using Off-Peak Interpolated Measurements

X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis

User-Friendly Software for the Analysis of Complex XRF Spectra

Achieving Nanoscale EDS Analysis in Transmission Scanning Electron Microscopy

Recent Developments in Laboratory X-ray Microanalytical Techniques for Electronic Structure, Chemical Composition, and Microstructure of Metals and Materials

AI Based 3D Image Analysis with GeoDict

Mapping Crystallographic (Dis)Order and Crystal Properties in Human Enamel

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis

Hyperspectroscopic Photoluminescence Imaging of Si Micropillar Arrays

Correlated Raman and SEM Measurements of Mineral Sections

Multimodal Analysis of Calcium Carbonate Polymorphs in Biological Systems

Structural Changes in Hard, Soft, and Biological Samples During Imaging: From Transmission Electron to Helium Ion Microscopy

Electron-beam-stimulated Atomic Migration Processes in Single-layer MoTe2

Harnessing the Electron Beam to Study Reactions in Graphene Liquid Cells and Degradation in Sensitive 2D Materials

Atomistic Understanding of Damage and Beam-driven Dynamics in 2D Materials

Microscopy and Microanalysis

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Volume 26 - December 2020

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis

Structural Changes in Hard, Soft, and Biological Samples During Imaging: From Transmission Electron to Helium Ion Microscopy