Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-27T01:53:12.377Z Has data issue: false hasContentIssue false
  • English
  • Français

Recording 4D-STEM Datasets at a Range of Beam Tilts Simultaneously with Multi-Beam Electron Diffraction

Published online by Cambridge University Press:  30 July 2020

Colin Ophus ,
Xuhao Hong ,
Steven Zeltmann ,
Karen Bustillo ,
Rohan Dhall ,
Benjamin Savitzky ,
Alexander Mueller  and
Andrew Minor
Colin Ophus
Affiliation:
Lawrence Berkeley National Lab, Berkeley, California, United States
Xuhao Hong
Affiliation:
Nanjing University, Nanjing, Jiangsu, China (People's Republic)
Steven Zeltmann
Affiliation:
University of California - Berkeley, Berkeley, California, United States
Karen Bustillo
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
Rohan Dhall
Affiliation:
Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, California, United States,
Benjamin Savitzky
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
Alexander Mueller
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
Andrew Minor
Affiliation:
Lawrence Berkeley National Lab, Berkeley, California, United States University of California - Berkeley, Berkeley, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 712 - 713
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C, Microscopy and Microanalysis 25, 563 (2019).10.1017/S1431927619000497CrossRefGoogle Scholar
Williams and Carter, Transmission electron microscopy: Diffraction, Imaging, and Spectrometry, Springer (2016).Google Scholar
Vincent, R and Midgley, P, Ultramicroscopy 53, 271 (1994).10.1016/0304-3991(94)90039-6CrossRefGoogle Scholar
Midgley, P and Eggeman, AS, IUCrJ, 2, 126 (2015).10.1107/S2052252514022283CrossRefGoogle Scholar
Zeltmann, SE et al. ., Ultramicroscopy 209, 112890 (2020).10.1016/j.ultramic.2019.112890CrossRefGoogle Scholar
Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. CO acknowledges additional support from the U.S. Department of Energy Early Career Research Award Program. SEZ was supported by STROBE, a NSF Science and Technology Center. BHS acknowledges support from the Toyota Research Institute.Google Scholar