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Volume 15 - April 2009

Contents

Page 36 of 47

Instrumentation and Techniques

Transmission Electron Microscopy & Scanning Transmission Electron Microscopy

Abstract

  • Using Holography to Evaluate CCD Camera Characteristics with High Accuracy

  • E Voelkl, D Tang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1100-1101
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Users Perspective of Remote TEM

  • G Brown, A-J Bons, A van Balen, M Anthonis, J Stuyver, S de Rocker, M Levulis, E Estrada, S Wapp, J Butler
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1102-1103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EFTEM, EELS, and Cathodoluminescence in Si-implanted SiO2 Layers

  • H-J Fitting, L Fitting Kourkoutis, R Salh, B Schmidt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1104-1105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Scanning Electron Microscopy & X-Ray Analysis

Abstract

  • SEM Contrast of Semi-insulating Compound Materials

  • H-J Fitting, JZ Kovacs
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1106-1107
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Iterative Autofocus Algorithms for Scanning Electron Microscopy

  • M Rudnaya, RMM Mattheij, JML Maubach
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1108-1109
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Porous Snow with SEM and Micro CT

  • RW Lomonaco, S Chen, I Baker
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1110-1111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Benefits Associated With a 1 mm Beam Gas Path Length on the Accuracy of X-ray Analysis in the Variable Pressure SEM

  • SJ Bean, VM Kugler, D Connor
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1112-1113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microscopy of High Chloride Primary Froth: Non-mixing of emulsified water

  • GRD Elliott, VA Munoz, RJ Mikula
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1114-1115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Scanning Electron Microscopy and Analysis of Moist, Wet and Liquid Specimens

  • P Echlin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1116-1117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM

  • V-D Hodoroaba, M Procop
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1118-1119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

  • M Procop, V-D Hodoroaba
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1120-1121
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM

  • V-D Hodoroaba, V Rackwitz, D Reuter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1122-1123
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Comparison of Experimental and Calculated Spatial Resolution in X-ray Microanalysis of Oxide and Silicate Minerals

  • KN Bozhilov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1124-1125
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The use of Au and Pt x-ray N lines for correct EDX analysis of C in gold and platinum depositions of micro and nano structures

  • JJL Mulders, A Botman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1126-1127
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Cation Stoichiometry from Microanalysis of Complex Perovskite Oxides

  • S Kolesnik, B Dabrowski, J Mais
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1128-1129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Surface Analysis techniques

Abstract

  • XPS Analysis of Fuel Cell Membrane Prepared Using an Ultra-Low-Angle-Microtomy Technique

  • HM Meyer, KS Reeves, KL More
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1130-1131
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Scanned Probe Microscopy

Abstract

  • Scanning Surface Potential Microscopy of Spores on Planar Surfaces

  • I Lee, E Chung, H Kweon, S Yiacoumi, DC Joy, A Palumbo, C Tsouris
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1132-1133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Size Dependent Dynamics of Cantilever Beams Immersed in Viscous Fluid

  • W Fei, Z Xuezeng
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1134-1135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Novel Operation Mode for Eliminating Influence of Inclination Angle and Friction in Atomic Force Microscopy

  • W Fei, W Yueyu, Z Faquan, Z Xuezeng
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1136-1137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Optical Fluorescence Microscopy

Abstract

  • Single-Molecule Electron Transfer Reaction in Nanomaterials

  • D Hu, C Lei, EJ Ackerman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1138-1139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 36 of 47