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Volume 15 - April 2009

Contents

Page 35 of 47

Physical Sciences

Magnetic, Semiconducting and Superconducting Materials

Abstract

  • Magnetic Alignment of Iron(III) Oxide Decorated CNT Polymer Composites

  • E Camponeschi, J Walker, H Garmestani, R Tannenbaum
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1060-1061
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Interfacial Misfit Array Formation for GaSb Growth on GaAs by Transmission Electron Microscopy

  • S Huang, G Balakrishnan, D Huffaker
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1062-1063
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Metals and Alloys

Abstract

  • Influence of Environment on Wear of Al-Si Alloys

  • I Baker, Y Sun, AT Dohner, FE Kennedy, PR Munroe
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1068-1069
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Influence of Stacking Fault Energy on the Temperature Dependent Deformation Mechanisms in High Mn-N Austenitic Stainless Steel

  • JE Wittig, JA Jiménez, G Frommeyer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1070-1071
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Continuous Cast AA2037 Al Alloy

  • E Kenik, Q Zeng, T Zhai
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1072-1073
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Specimen Preparation for Materials Sciences

Abstract

  • Sample Preparation of Epitaxial InN Layers for Transmission Electron Microscopy

  • Z Liliental-Weber, M Hawkridge, D Erwin, M Libbee
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1074-1075
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Automated Sample Preparation of Nanoscale Devices for FESEM

  • RR Cerchiara, PE Fischione, MF Boccabella, AC Robins
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1076-1077
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Instrumentation and Techniques

Transmission Electron Microscopy & Scanning Transmission Electron Microscopy

Abstract

  • Energy-filtered Diffracted Beam Interferometry/Holography (DBI/H)

  • R Herring, T Tanji
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1078-1079
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Annular Dark Field Imaging of Catalyst Nanoparticles in Single Shot Dynamic Transmission Electron Microscopy

  • D Masiel, B Reed, T LaGrange, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1082-1083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • New developments in phase Contrast Transmission Electron Microscopy with Electrostatic Phase Plate

  • D Alloyeau, WK Hsieh, E Anderson, G Benner, MJ Park, ED Gomez, NP Balsara, C Kisielowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1086-1087
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions

  • A Badami, M Beach, S Wood, S Rozeveld, J Marshall, W Heeschen, E Czerwinski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1088-1089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • REW program for the HRTEM image simulation, the alignment and the focus variation image reconstruction

  • F Lin, J Weng, J Chen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1090-1091
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Near/Sub-50 pm TEM Resolution Images of Atoms Simulated with the Second Derivative of the Exit-Plane Wavefunction

  • HS Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1092-1093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fourier Analysis of Ronchigram and Aberration Assessment

  • K Ishizuka, K Kimoto, Y Bando
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1094-1095
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Observer Development for Automatic STEM Closed-Loop Control

  • A Tejada Ruiz, AJ den Dekker, SW van der Hoeven
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1096-1097
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 35 of 47