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Volume 15 - April 2009

Contents

Page 38 of 47

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

  • Z Zhang, X Han
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1182-1183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Probing the Mechanical Properties of Nanostructures in the TEM

  • A Minor, J Ye, C Chisholm, R Mishra, Z Shan, O Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1184-1185
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Semiconductor Nanowires by HRTEM and In-Situ TEM

  • N Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1186-1187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative TEM Tensile Testing on 1D Nano-structural Materials

  • ZW Shan, J Oh, A Minor, SAS Asif, OL Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1188-1189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Study of Pt Cluster Incorporated Zeolite A

  • Y Shi, F Wang, J Qian, H Yang, L Ding, P Li, S Ng, J Chen, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1190-1191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Direct Observation of TiO2 (110) Surfaces by HVEM and HAADF STEM

  • N Shibata, A Goto, T Mizoguchi, S Findlay, SY Choi, T Yamamoto, I Yuichi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1194-1195
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Description of the Interface Between γ and γ′ Particles in a Ni-Al Alloy by HREM.

  • H Calderon, L Calzado-Lopez, T Mori
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1196-1197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration-Corrected STEM Imaging and 2-D Elemental-Resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

  • HL Xin, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1198-1199
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In Situ and High Resolution TEM Studies of Nano-scale Materials

  • R Sinclair, AL Koh, P Kempen, HJ Jung
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1200-1201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Anisotropic FCC Metal Nanostructures by Kinetically Controlled Synthesis

  • J Wang, Y Xiong, B Lim, Y Xia, MJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1202-1203
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Microstructual Study of Architecturally-Controlled Pt-Ru Core/Shell and Alloy Nanoparticles

  • S Alayoglu, L-C Lai, W-A Chiou, B Eichhorn
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1206-1207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of Protocols Suitable for Atomic-Scale Imaging of Catalyst Clusters at Catalytic Temperatures

  • L Germinario, LF Allard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1208-1209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Amorphous Structure and Stability of Mn Implanted GeC Ferromagnetic Semiconductor

  • C Sun, HC Floresca, J Wang, M Jamil, S Guchhait, DA Ferrer, SK Banerjee, G Lian, L Colombo, MJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1216-1217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Energy Loss Spectroscopy Study on the Dielectric Response of Single H2Ti3O7 Nanotube

  • J Wang, Q Li, LM Peng, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1218-1219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructures

  • LJ Chen, W-W Wu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1220-1221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 38 of 47