Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Volume 8 - August 2002

Abstract

Planarization Processes for Pre-FIB Sample Preparation

“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

Applications (Fun and Practical) of FIB Nano-Deposition and Nano-Machining

EELS Measurements on Wurtzite InN

The Electronic Structure of Threading Dislocations in GaN

New Developments In EELS Applied To Interface Study In Magnetoresistive Tunnel Junctions With Manganites

Artificial Charge Modulations in La-doped SrTiO3 Superlattices

Atomic Scale Models for Grain Boundary Potentials in Perovskites

Probing the Metal-Insulator Transitions in Complex Oxides with EELS Near- Edge Structures

Analysis of 4 d Transition Metal Oxides by EELS

Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM

Performance and First Results of a New 200 kV FEG-EFTEM

A Simple Internal Active Field Compensator For Post Column Spectrometers

New Approach to Obtain Elemental Maps by Using Energy-Filterd Images

Improvements in Spatially Resolved Characterization Using Eels and Eftem Spectrum-Image Datasets

Characterisation of Exsolution Phenomena by Mapping Eels Fine Structure

Combining Eels and Angle-Resolved Aes to Measure Shallow Profiles of Thin Nitrided Oxide Films on Si

Background Removal and Data Analysis for Low-Loss Transmission Electron Energy-Loss Spectroscopy

In Situ Determination of Local Ce Oxidation States During Redox Reactions

Comparison of ELNES and NEXAFS of vanadium oxide V2O5 with different spectral resolution

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract