Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Eleven Thousand Interference Fringes by 1-MV Field Emission Electron Microscope

Observation of Vortices and Columnar Defects by Using Lorentz Microscopy

Phase Contrast Images of Superconducting Pancake Vortices

Vortex Modeling in High-Tc Anisotropic Materials

Fast and Robust Phase Unwrapping Algorithm for Electron Holography

Quantitative Phase Imaging and Differential Interference Contrast for Biological TEM

Holographic Setup for 2D-Dopant Profiling using the Lorentz-Lens

Ferroelectric Electron Holography

Improved Information Recovery in Phase Contrast EM for non-two-fold symmetric Boersch phase plate geometry

FIB Preparation of Mesa Structures for SIMS Analysis

EBSD Performed “In-Situ” on a Dual-Beam FIB

Enhanced Site specific Preparation of SEM Cross Sections and TEM Samples by using CrossBeam Technology

Identification of Cleavage Origins Using Focused Ion Beam (FIB) Sectioning

A Site- and Layer-Specific Sample Preparation Technique for Plan View TEM of Laser Diodes

3D Microscopy and Microanalysis of Heterogeneous SEM Samples by Broad Ion Beam Processing: Cutting - Etching - Coating

Deformation of in xGa1-xas Superlattices Under Bending and Nanoindentation

Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens

Focused Ion Beam (FIB) Microscopy and Technology

Marriage Of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM

Application of FIB and TEM for the Characterization of Dewetting Behavior on Ceramics

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Volume 8 - August 2002

Abstract