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Comparison of ELNES and NEXAFS of vanadium oxide V2O5 with different spectral resolution

Published online by Cambridge University Press:  01 August 2002

D.S. Su ,
M. Hävecker ,
A. Knop-Gericke ,
R. Mayer ,
C. Hebert  and
R. Schlögl
D.S. Su
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, D-14195 Berlin, Germany
M. Hävecker
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, D-14195 Berlin, Germany
A. Knop-Gericke
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, D-14195 Berlin, Germany
R. Mayer
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, D-14195 Berlin, Germany
C. Hebert
Affiliation:
Institut für Angewandte und Technische Physik, Technische Universität Wien, Wiedner Hauptstraße 8-10, A-1040 Wien, Austria
R. Schlögl
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, D-14195 Berlin, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 602 - 603
Copyright
Copyright © Microscopy Society of America 2002