Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

XML for Microanalysis: EMSA/MAS Spectrum File Format 2.0?

Spectral image analysis: Getting the most from all that data

Structure Factor Phase and Amplitude Measurement in Aln by Qcbed

Effect of Anisotropic Lattice Vibration in CBED Intensities and Detection of Local Change in Oxygen Deficiency of YBa2Cu3O7-x

A Study of Bonding in Copper by QCBED Measurements

Automated Crystallography and Grain Mapping in the TEM

Progress towards Quantitative Electron Nanodiffraction

On the Amplitude Origin Problem in Dynamical Direct Methods

Why does the hkl: h+k+l = 4n+2 reflections reveal intensity in Si [110]?

Crystallographic Analysis of Orientational Variants in PbZr0.52Ti0.48O3 Ferroelectric Perovskite

Microstructure of Thick Polycrystalline Silicon Films for MEMS Application

Systematic Characterization of Reciprocal Space by SAED: Advantages of a Double-Tilt, Rotate Holder

EBSD Spatial Resolution in the SEM when Analyzing Small Grains or Deformed Material

A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging verses Diffraction Techniques

Microstructure of TiN Coatings by EBSD Techniques

Orientation Analysis of Ultra-fine Grained Bulk Materials Produced by Accumulative Roll-bonding (ARB) Process by the Use of EBSP Technique

Application of Orientation Imaging Microscopy in the TEM to studies of nano-crystalline materials

Determination of Activated Slip Systems in Experimentally Deformed Olivine- Orthopyroxene Polycrystals using EBSD

Chemistry Assisted Phase Differentiation in Automated Electron Backscatter Diffraction

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract