Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Observation of Non-uniformities in Calcium Aluminosilicate Glass using EELS

Chemical Bonding Analysis of AlN Polytypes by ELNES

Exelfs and Exafs: Complementary Probes into the Structure of Metallic Glasses

Characterization of Boron Containing Graphite Using TEM and EELS

Performance of Corrected Imaging Energy Filters

A New High Stability, 4th Order Aberration Corrected Spectrometer and Imaging Filter for a Monochromated Tem

Parallel EELS characterization of TiC commercial powder

AEM Investigation of Strontium Substituted La-Co-Perovskites

Optimizing EELS data sets using ‘a priori’ spectrum simulation

Contributions of Inelastically Scattered Electrons to Defect Images

Electron Energy Loss Spectroscopy Study of NbC Precipitates in an Ultra-Low Carbon Hot-Rolled Microalloyed Steel

Further Applications of Energy Filtered TEM in Semiconductor Devices

Electron Beam Induced Damage in Wurtzite InN

A Next Generation Imaging Filter for High Voltage Electron Microscopy

A Faster Approach to Spectrum Imaging and Elemental Mapping in Stem

Chromophore Mapping via Low-Energy Loss Imaging in a Modified EM902: Formation of the Immune Synapse

Localization of Low Energy Losses and the Mixed Dynamic Form Factor

An EFTEM Study of Polyimide Adhesion to Single-Walled Carbon Nanotube Bundles

Transition Edge Sensor Fabrication

Detectors Capable Of High Countrates and High Speed Pulse Processing Electronics for X-Ray Spectroscopy

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract