Hostname: page-component-7bb8b95d7b-dtkg6 Total loading time: 0 Render date: 2024-09-18T01:14:50.197Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterisation of Exsolution Phenomena by Mapping Eels Fine Structure

Published online by Cambridge University Press:  01 August 2002

Ute Golla-Schindler ,
Günter Lang  and
Gerd Benner
Ute Golla-Schindler
Affiliation:
LEO Elektronenmikroskopie GmbH, D-73446 Oberkochen, Germany
Günter Lang
Affiliation:
LEO Elektronenmikroskopie GmbH, D-73446 Oberkochen, Germany
Gerd Benner
Affiliation:
LEO Elektronenmikroskopie GmbH, D-73446 Oberkochen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 594 - 595
Copyright
Copyright © Microscopy Society of America 2002