Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

New Approach For Ultra-Stable TEM-Column Support Frame

Realization of a Field Emission Gun with Advanced Köhler Illumination

Novel techniques for image process in electron probe microanalysis

Image Simulation of Gold Cluster Detection in TEM and STEM

Deconvolution Process of High-Resolution HAADF STEM Images

High-Resolution HAADF STEM of Inversion Boundaries in Sb2O3-Doped Zinc Oxide

Families of Particle-Like Fractals with Differing Shapes and Boundary Fractal Dimensions

Semi-Automatic Tools to Segment Sem Images of Particles

Pit depth quantification of PM Aluminum Composites using Scanning Electron Microscopy and Image Analysis

Image Analysis in PM Aluminum Composites. Matrix/Reinforcement Characterization

HREM Study of Fullerenes Impact in a Metallic Matrix

A New Computerised Method of Multiple Labelling Detection and Particle Evaluation

Confocal Holography

Phase Retrieval, Symmetrization Rule and Transport-of-Intensity Equation in Application to Induction Mapping of Magnetic Materials

Image interpretation of magnetic domains in Nd2Fe14B hard magnets

Observation of Chain Structure of Superconducting Vortices by Lorentz Microscopy

Practical Considerations for Electron Holography on Doped Semiconductor Devices

Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography

Low Voltage Nanotip Interferometry

Development of a Direction-Free Magnetic Field Application System

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract