Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Progress Towards More Realistic In-Situ Microscopy Observations

In-situ Observation of Alloy Phase Formation in Isolated Nanometer-sized Particles

High Resolution In-situ SEM of Competitive Particle Sintering and Other Surface Processes

Real Time Uhv-Hrtem Observation Of Si(111)√3x√3-Pd Surface And Dynamic Motion Of Pd Clusters

In situ Molecular Imaging of Heterogeneous Catalytic Processes in Liquid Environments

In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope

In Situ HREM of Crystallization Reactions

Aberration Correction for Analytical In Situ TEM – the NTEAM Concept.

In situ Transmission Electron Microscopy of Copper Electrodeposition

Local Measurement of Reaction Kinetics Using in situ Transmission Electron Microscopy

X-ray Microanalysis of Light Elements

Charging at the Steady State in EPMA, SEM and ESEM

Capability and Uncertainty in Multilayer Quantitative Procedure with Electron Probe Microanalysis

On the Simulation of True EDS X-Ray Spectra

The Influence of X-ray Counting Statistics on Trace Analysis and Spatial Resolution

Low-Overvoltage Microanalysis: an Alternative High Resolution Strategy to Low-Voltage Microanalysis

X-ray emission induced by low energy electrons

A Simple Method For Determining Optimum Corrections For High-Accuracy Epma In Difficult Chemical Systems

Spectral imaging: Towards Quantitative X-ray Microanalysis

Infrared microscopic analysis of tissues: a comparison of methodologies.

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract