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Novel techniques for image process in electron probe microanalysis

Published online by Cambridge University Press:  01 August 2002

N. Mori ,
H. Takahashi ,
M. Takakura  and
C. Nielsen
N. Mori
Affiliation:
JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japn
H. Takahashi
Affiliation:
JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japn
M. Takakura
Affiliation:
JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japn
C. Nielsen
Affiliation:
JEOL USA Inc., 11 Dearborn Road Peabody, MA 01960, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 488 - 489
Copyright
Copyright © Microscopy Society of America 2002