Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-19T10:18:51.467Z Has data issue: false hasContentIssue false
  • English
  • Français

Deconvolution Process of High-Resolution HAADF STEM Images

Published online by Cambridge University Press:  01 August 2002

M. Shiojiri ,
K. Watanabe ,
N. Nakanishi ,
T. Yamazaki ,
M. Kawasaki ,
A. Recnik  and
M. Ceh
M. Shiojiri
Affiliation:
Kyoto Institute of Technology, 606-8585, Japan
K. Watanabe
Affiliation:
Tokyo Metropolitan College of Technology, 140-0011, Japan
N. Nakanishi
Affiliation:
Department of Physics, Tokyo University of Science, 162-8601, Japan
T. Yamazaki
Affiliation:
Department of Physics, Tokyo University of Science, 162-8601, Japan
M. Kawasaki
Affiliation:
JEOL USA Inc. Dearborn Road, MA. 01960
A. Recnik
Affiliation:
Institute of Jožef Stefan, 1000 Ljubljana, Slovenia
M. Ceh
Affiliation:
Institute of Jožef Stefan, 1000 Ljubljana, Slovenia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 492 - 493
Copyright
Copyright © Microscopy Society of America 2002