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Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography

Published online by Cambridge University Press:  01 August 2002

A.C. Twitchett ,
R.E. Dunin-Borkowski  and
P.A. Midgley
A.C. Twitchett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK
R.E. Dunin-Borkowski
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK
P.A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 518 - 519
Copyright
Copyright © Microscopy Society of America 2002