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Volume 19 - August 2013

Contents

Page 51 of 70

Instrumentation Sciences

A16.02 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • Designing the Optimal Quantitative Electron Probe X-ray Microanalysis Measurement

  • N.W. Ritchie, D.E. Newbury
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1248-1249
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Effect of the Probe Size and Interaction Volume on Quantitative X-ray Maps across Interfaces of a Cu-Al Roll Bonded Laminate

  • H. Demers, R. Wuhrer, K. Moran, R. Gauvin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1250-1251
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Testing Analytical Precision Using Adaptive Shaping at High Throughput

  • R.B. Mott, O.E. Healy, N.W.M. Ritchie, A.P. Lindstrom
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1252-1253
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A16.03 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • Development of an Analytical TEM with a TES Microcalorimeter EDS

  • T. Hara, K. Maehata, K. Mitsuda, N.Y. Yamasaki, K. Tanaka, Y. Yamanaka
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1260-1261
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Direct Comparison of X-ray Detector Solid Angles in Analytical Electron Microscopes

  • N.J. Zaluzec
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1262-1263
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Practical Measurement of X-ray Detection Performance of a Large Solid-Angle Silicon Drift Detector in an Aberration-Corrected STEM

  • M. Watanabe, C. Wade
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1264-1265
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A16.04 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • The Real World Practical Issues and Limitations of Silicon Drift Detectors on Electron Microscopes

  • A. Sandborg, M. Coy, B. Hammell, R. Buchhold
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1266-1267
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • X-ray K-ratios Derived Using Extreme Overvoltage Conditions

  • I. Onwuzu, J.J. Donovan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1268-1269
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Improved SDD Detectors for Ultra-Fast, High-Resolution EDS in Microanalysis

  • A. Niculae, M. Bornschlegl, R. Eckhardt, J. Herrmann, S. Jeschke, G. Krenz, A. Liebel, G. Lutz, H. Soltau, L. Strüder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1270-1271
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Combined Quantitative Analysis Using both Micro-XRF and EDS Analysis Inside the Scanning Electron Microscope

  • K.C. Witherspoon, R. Lamb, P. Sjoman, M.D. Hellested
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1272-1273
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • EDS Assisted by Precessing Electron Beam

  • Y. Liao, L.D. Marks
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1274-1275
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A16.P1 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • Determination of the L- and M-Subshell X-Ray Production Cross Sections for Pb and U Using an Electron Microprobe

  • A. Moy, C. Merlet, X. Llovet, O. Dugne
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1280-1281
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Re-sampling of SEM-EDS Element Maps to Characterize the Length-Scale of Elemental Heterogeneity

  • C.S. Todd, W. Heeschen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1282-1283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Th-U-Pb Dating of Lunar Granites by X-Ray Microanalysis

  • S.M. Seddio, B.L. Jolliff, R.L. Korotev, P.K. Carpenter
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1284-1285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 51 of 70