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Testing Analytical Precision Using Adaptive Shaping at High Throughput

Published online by Cambridge University Press:  09 October 2013

R.B. Mott ,
O.E. Healy ,
N.W.M. Ritchie  and
A.P. Lindstrom
R.B. Mott
Affiliation:
PulseTor LLC, 1580 Reed Road, Suite C2, Pennington NJ 08534 USA
O.E. Healy
Affiliation:
PulseTor LLC, 1580 Reed Road, Suite C2, Pennington NJ 08534 USA
N.W.M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 USA
A.P. Lindstrom
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 USA

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1252 - 1253
Copyright
Copyright © Microscopy Society of America 2013