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The Real World Practical Issues and Limitations of Silicon Drift Detectors on Electron Microscopes

Published online by Cambridge University Press:  09 October 2013

A. Sandborg ,
M. Coy ,
B. Hammell  and
R. Buchhold
A. Sandborg
Affiliation:
M. Coy
Affiliation:
B. Hammell
Affiliation:
R. Buchhold
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1266 - 1267
Copyright
Copyright © Microscopy Society of America 2013