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Volume 19 - August 2013

Contents

Page 52 of 70

Instrumentation Sciences

A16.P1 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • Structure and Composition Determination from Fluctuation X-ray Scattering

  • D. Li
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1288-1289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Chemical Quantification of Oxygen by EDXS in the Oxidation of the Ni-Mo-W System

  • C. Angeles-Chavez, J.A. Toledo-Antonio, M.A. Cortes-Jacome
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1290-1291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Achieving Accurate Estimates of Material Composition from Spectrum Images

  • P.J. Statham
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Model Unknown Glass Engineered for EPMA WDS Quality Assurance

  • D.C. Meier, J.M. Davis, J.R. Anderson, S.A. Wight
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach

  • S. Richter, P.T. Pinard, N. Mevemkamp, M. Torrilhon
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Chemical Quantification of Atomic-scale EDS Maps under Thin Specimen Conditions

  • P. Lu, M. Van Benthem, Q. Jia
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1298-1299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A17.01 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • New Revolutionary Hybrid SEM by Carl Zeiss

  • M. Bolorizadeh, F. Panteleit, F. Hitzel
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • New Ultra-High Resolution SEM for Imaging by Low Energy Electrons

  • J. Jiruse, M. Havelka, J. Polster, F. Lopour
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advanced Nanofabrication using Helium, Neon and Gallium Ion Beams in the Carl Zeiss Orion NanoFab Microscope

  • D. Elswick, M. Ananth, L. Stern, J. Marshman, D. Ferranti, C. Huynh
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

  • S. Zaefferer, S. Kleindiek, K. Schock, B. Volbert
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Expanding the Boundaries of FIB-SEM Technology: Developments for Best Application Results

  • I. Schulmeyer, M. Kienle
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Latest Innovation on FE-SEM and Its Applications

  • S. Takeuchi, H. Sato, O. Takagi, D. Hoyle
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A17.02 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • High Throughput, High Quality Analysis in the Electron Microscope

  • A. Hyde, J. Goulden, N. Rowlands, S. Ubhi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Recent Advancements in Laboratory X-ray Microscopes enabling 3D and 4D Science

  • A. Merkle, J. Gelb
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • An Improved Low Energy X-ray Transmission Window

  • S. Liddiard, M. Coffin, M. Zappe, J. Abbott, C. Hustedt, K. Zufelt, L. Pei, J. Lund, R. Vanfleet, R. Davis
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1316-1317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High Spatial Resolution, Energy Resolved Imaging with the pnCCD Color X-ray Camera

  • S. Ihle, H. Ryll, H. Soltau, A. Liebel, O. Scharf, A. Bjeoumikhov, M. Schmidt, L. Strüder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Visualizing and Correcting Dynamic Specimen Processes in TEM Using a Direct Detection Device

  • B.E. Bammes, D.-H. Chen, L. Jin, R.B. Bilhorn
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1320-1321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A17.P1 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • TEM Sample Preparation Made Easier: Ar Ion Mill that Counts Reflected Light Fringes and Runs Recipes Automatically

  • A. Pakzad
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Application of Low Energy Broad Ion Beam Milling to Improve the Quality of FIB Prepared TEM Samples

  • A. Pakzad, S. Mick, C. Vartuli, J. Chung, G. Lian
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 52 of 70