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First Measurement Results of new SDD Detectors with DEPFET Based readout Node and Minimized Input Capacitance

Published online by Cambridge University Press:  09 October 2013

J. Treis ,
A. Bähr ,
R. Eckhardt ,
K. Heinzinger ,
K. Hermenau ,
G. Lutz ,
P. Majewski ,
A. Niculae ,
H. Soltau  and
L. Strüder
J. Treis
Affiliation:
A. Bähr
Affiliation:
R. Eckhardt
Affiliation:
K. Heinzinger
Affiliation:
K. Hermenau
Affiliation:
G. Lutz
Affiliation:
P. Majewski
Affiliation:
A. Niculae
Affiliation:
H. Soltau
Affiliation:
L. Strüder
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1276 - 1277
Copyright
Copyright © Microscopy Society of America 2013