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Re-sampling of SEM-EDS Element Maps to Characterize the Length-Scale of Elemental Heterogeneity

Published online by Cambridge University Press:  09 October 2013

C.S. Todd  and
W. Heeschen
C.S. Todd
Affiliation:
W. Heeschen
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1282 - 1283
Copyright
Copyright © Microscopy Society of America 2013