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Volume 19 - August 2013

Contents

Page 50 of 70

Instrumentation Sciences

A15.01 Low Voltage Transmission Microscopy: Pros and Cons

Abstract

  • Application of Low Voltage Transmission Electron Microscopy

  • D.C. Bell
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1208-1209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Pros and Cons of Low-kV Transmission Electron Microscopy

  • R. Egerton
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1212-1213
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A15.02 Low Voltage Transmission Microscopy: Pros and Cons

Abstract

  • Quantitative Low-Voltage STEM imaging in the Presence of Temporal Incoherence

  • M.P. Oxley, S.J. Pennycook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1216-1217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Current Status of the Sub-Angstrom Low-Voltage Electron Microscopy (SALVE) Project

  • U.A. Kaiser
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1218-1219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low-Voltage TEM/STEM for Atomic Resolution Imaging and Spectroscopy

  • K. Suenaga, T. Sasaki, H. Sawada
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1220-1221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low-Voltage Atomic-Resolution Off-Axis Holography on Hexagonal Boron Nitride

  • M. Linck, P. Ercius, C. Ophus, N. Alem, A. Zettl, U. Dahmen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1222-1223
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A15.P1 Low Voltage Transmission Microscopy: Pros and Cons

Abstract

  • Imaging Atomic Dynamics in 2D Silica Glass with Low-Voltage Aberration-Corrected TEM

  • P.Y. Huang, J.S. Alden, S. Kurasch, A. Shekhawat, A.A. Alemi, J.P. Sethna, U. Kaiser, D.A. Muller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1224-1225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy

  • J.M. Yuk, H.Y. Jeong, N.Y. Kim, M.J. Lee, J.Y. Lee, Z. Lee
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1226-1227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Physical Limitations on Transmission Electron Microscope Imaging of Lithium Battery Materials

  • B.D. Levin, D.A. Muller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1228-1229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Spectroscopic Studies on Nitrogen-doped Multi-Walled Carbon Nanotubes Using Monochromated STEM-EELS at Low-Voltage

  • R. Arenal
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1230-1231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low Voltage STEM for the Study of Defects in 2D Materials

  • W. Zhou, J. Lee, M.D. Kapetanakis, M.P. Prange, A.R. Lupini, S.T. Pantelides, J.-C. Idrobo, S.J. Pennycook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1232-1233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Contrast Enhancement in Low-kV Zero-loss Filtered Imaging of Frozen-hydrated Biological Specimen

  • E. Majorovits, G. Hofhaus, I. Angert, G. Benner, U. Kaiser, R.R. Schröder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1234-1235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low Energy Scanning Transmission Electron Microscope

  • I. Mullerova, E. Mikmekova, I. Konvalina, L. Frank
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1236-1237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A16.01 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • Quantitative X-ray Microanalysis of Multi-layered Specimens: Capability and Accuracy

  • C. Merlet
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1240-1241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Measurement strategies for Quantification of Carbon in Steel using EPMA

  • P.T. Pinard, A. Aretz, J. Börder, J. Donovan, S. Richter
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1242-1243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Quantitative SEM/EDS, Step 1: What Constitutes a Sufficiently Flat Specimen?

  • D.E. Newbury, N.W. Ritchie
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1244-1245
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Challenges and New Approaches for Quantitative X-Ray Analysis in SEM at Low Beam Voltages

  • P.J. Statham
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1246-1247
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 50 of 70