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Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution

Published online by Cambridge University Press:  09 October 2013

H. Takahashi ,
N. Handa ,
T. Murano ,
M. Terauchi ,
M. Koike ,
T. Imazono ,
N. Hasegawa ,
M. Koeda ,
T. Nagano  and
H. Sasai
...Show all authors
H. Takahashi
Affiliation:
N. Handa
Affiliation:
T. Murano
Affiliation:
M. Terauchi
Affiliation:
M. Koike
Affiliation:
T. Imazono
Affiliation:
N. Hasegawa
Affiliation:
M. Koeda
Affiliation:
T. Nagano
Affiliation:
H. Sasai
Affiliation:
Y. Oue
Affiliation:
Z. Yonezawa
Affiliation:
S. Kuramoto
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1258 - 1259
Copyright
Copyright © Microscopy Society of America 2013