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Volume 19 - August 2013

Contents

Page 48 of 70

Instrumentation Sciences

A14.01 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Quantifying oxygen vacancies in fuel-cells materials using atomic EELS analysis

  • P. Longo, M.F. Chisholm, M. Varela, A.R. Lupini, R.D. Twesten
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1128-1129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atomic-Scale Optical and Vibrational Spectroscopy with Low Loss EELS

  • P. Cueva, D. Muller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1130-1131
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Method to Estimate the Range of Validity of the Thin Film Approximation for Dielectric Function Determination in Nanostructures

  • J. Zhu, P.A. Crozier, J.R. Anderson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1132-1133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.02 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Analysis of the Light Element Sensitivity and Measurement Time of the Multiple EDX Pole Shoe Detector Rococo2

  • A. Liebel, M. Bornschlegl, R. Eckhardt, S. Jeschke, A. Niculae, H. Soltau
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1134-1135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Detection of Lithium X-rays by EDS

  • L. Xiaobing, J. Holland, S. Burgess, S. Bhadare, S. Yamaguchi, D. Birtwistle, P. Statham, N. Rowlands
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1136-1137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Ultrahigh Resolution EDX Spectrum Imaging: Nuclear Materials Applications

  • E. Francis, S. Haigh, G. Burke, A. Gholinia, M. Preuss
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1138-1139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Resolving Ambiguities at the Bi2Te3/GaAs Interface with Atomic Resolution EDS

  • J.H. Dycus
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1140-1141
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Using Windowless EDS Analysis of 45-1000eV X-ray Lines to Extend the Boundaries of EDS Nanoanalysis in the SEM

  • S. Burgess, H. James, P. Statham, L. Xiaobing
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1142-1143
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Multi-detector STEM-EDS mapping of ion-irradiated nanostructured ferritic alloys

  • C. Parish, R.M. White, J.M. LeBeau, Y. Zhang, M.K. Miller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1144-1145
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.03 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Development of a Laser Phase Plate for Zernike Phase Contrast in Electron Microscopy

  • M. Xu, E. Sohr, B. Shevitski, R. Glaeser, H. Mueller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1146-1147
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Development of a Contact-Potential-Type Phase Plate

  • H. Tamaki, H. Kasai, K. Harada, Y. Takahashi, R. Nishi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1148-1149
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Implementing Direct Electron Detection Camera K2 and Dose Fractionation for Near Atomic Resolution Single Particle CryoEM

  • X. Li, S. Zheng, D.A. Agard, Y. Cheng
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1152-1153
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.04 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Photoelectron-Pulse Properties from Free-Free Transitions in Ultrafast Transmission Electron Microscopy

  • D.J. Flannigan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1158-1159
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High Brightness Photocathodes for Ultrafast TEM: A New Paradigm

  • B.L. Rickman, J.A. Berger, A.W. Nicholls, W.A. Schroeder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1162-1163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.05 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Addition, Subtraction, and Analysis of Orbital Angular Momentum in Electron Vortex Beams

  • T. Yahn, J.S. Pierce, T.R. Harvey, B.J. McMorran
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1166-1167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 48 of 70