Microscopy and Microanalysis: Volume 9 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

Microstructure Characterization of Nanoscale Dielectric Layers on Niobium

Off-axis Electron Holography for 2D Dopant Profiling in p- and n-Metal Oxide Semiconductor Field Effect Transistors (MOSFETs)

TEM Microstructure Investigations of Mixed (100)/(118)-Oriented Ferroelectric Bi3.25La0.75Ti3O12 Films

Co-Deposition, Dissolution and Replacement Process during Electrochemical Deposition of Co/Cu Multilayers

Mechanical Size-Effects and Dislocation Dynamics in Cu Thin Films

Microstructure and degradation mechanisms of TaSiN diffusion barriers for Cu interconnects

Microstructure of Al/Ti Metallization Layers

New Components in Production of Hard Material Multilayers

Real-Time Observation of Magnetisation Processes in Magnetic Thin Films by Means of Time-Resolved Photoemission Electron Microscopy

Microstructural Evaluation of Compositional Fluctuations in AlGaN Grown on 6H-Sic Substrates

Ferroelectric Holography

Transmission Electron Microscopy Study of Mn4Si7 Growth on (001)Si

Microstructure of compositionally graded TiAlSiN thin films investigated by conventional and HRTEM

In Situ SEM Investigation of Al and Cu SAW Devices Behaviour under High Power Load

TEM Investigations of Cross-Sectional Prepared Organic Light Emitting Devices

Barium diffusion and calcium segregation in manganite thin films

Electron tomography of inlaid copper interconnect structures

SEM/EBSD Texture Analysis of Electrochemically Deposited CuAg-Alloy Thin Films

Characterization of strain fields in Si1-xGex island structures by means of quantitative high-resolution electron microscopy

Analysis of Nanoscale Co Pillars by Means of ATEM

Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers