Microscopy and Microanalysis: Volume 9 - Issue S03

Only show content I have access to (1)

Over 3 years (269)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 9 - Issue S03 - September 2003

Invited Papers

The role of Promoters in Tungstated Zirconia Catalysts

Pt/SiO2 Model Catalyst: Metal Support Interaction Studied by TEM and EELS

Structural and Electronic Properties of Au Colloids with Different Cappings

Defects in hexagonal SiC analyzed by Molecular Dynamics and HRTEM image simulations

Structural characterization of silicon nanostructures by energy filtered transmission electron microscopy

High-Resolution Transmission Electron Microscope Investigations of Self-Patterned Epitaxial Pb(Zr0.52Ti0.48)O3 Nanocrystals

Large scale 2-D arrays of magnetic nanoparticles

TEM investigations of Ga(Sb,As) quantum dots grown on a seed layer of (In,Ga)As quantum dots

Magnetic Switching of Permalloy Nanostructures observed by Electron Holography

Analyses of Nanostructure Formation by Cu Deposition onto VSe2 Surfaces

TEM Characterization of Nanostructured Materials - Opportunities and Challenges

HRTEM study of growth-correlated properties of (Si,Ge) islands

Image Processing for Quality Enhancement of 2D Dopant Distribution Maps of MOSFET's using Electron Holography

Scanning Electron Microscopy and Atomic Force Microscopy of Registered Arrays of Perovskite Oxide Nanostructures

TEM and EFTEM characterization of WS2 Nanotubes

Complex Characterization of Interlayer Systems in Semiconductors Industry Using Imaging and Analytical TEM

Segregation in InGaAs/GaAs Quantum Wells: MOCVD versus MBE

Nanostructures simulated by molecular dynamics for TEM analysis

Structure factors for the composition determination of InGaAs/GaAs quantum wells with the 002 beam: Isolated atom approximation versus density functional theory

Electron Microscopic Investigations on Nonporous Coated Spherical Silica

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 9 - Issue S03 - September 2003

Invited Papers