Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-23T18:05:26.456Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructural Evaluation of Compositional Fluctuations in AlGaN Grown on 6H-Sic Substrates

Published online by Cambridge University Press:  05 September 2003

R. Kröger ,
S. Einfeldt ,
Z. J. Reitmeier ,
D. Hommel  and
R.F. Davis
R. Kröger
Affiliation:
Institute of Solid State Physics, University of Bremen, P.O. Box 330440, 28334 Bremen, Germany
S. Einfeldt
Affiliation:
Institute of Solid State Physics, University of Bremen, P.O. Box 330440, 28334 Bremen, Germany
Z. J. Reitmeier
Affiliation:
North Carolina State University, Dept. of Materials Science and Engineering, Campus Box 7907, Raleigh, NC 27695
D. Hommel
Affiliation:
Institute of Solid State Physics, University of Bremen, P.O. Box 330440, 28334 Bremen, Germany
R.F. Davis
Affiliation:
North Carolina State University, Dept. of Materials Science and Engineering, Campus Box 7907, Raleigh, NC 27695
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 256 - 257
Copyright
Copyright © Microscopy Society of America 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)