Microscopy and Microanalysis: Volume 9 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Volume 9 - Issue S03 - September 2003

Contents

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Invited Papers

Non-Invasive Electron Microscopic Rapid Virus Diagnosis of Negative-Stained Urine Samples can be Useful in the Diagnosis and Monitoring of Polyomavirus Infections in Renal Transplant Recipients
Josef A. Schroeder, Bernhard K. Krämer, Ferdinand Hofstaedter
Published online by Cambridge University Press:

05 September 2003, pp. 520-521
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Emerging viruses – a challenge to diagnostic Electron Microscopy
Dirk Soike
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05 September 2003, pp. 522-523
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Real time SEM imaging of FIB milling processes for extended accuracy in Cross Sectioning and TEM Preparation
P. Gnauck, U. Zeile, W. Rau, M. Schumann
Published online by Cambridge University Press:

05 September 2003, pp. 524-525
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Thinning and Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy
Wolfgang Gruenewald
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05 September 2003, pp. 526-527
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Critical Dimension Analysis of Thin (~100 nm) Gold Coatings by SEM and EDS
Parvati Ramaswamy, S. Vynatheya, S. Seetharamu
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05 September 2003, pp. 528-529
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Improving image storage and access in an integrated microscopy unit: experiences with a commercial image database system
S.S. Biel, R. Wepf
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05 September 2003, pp. 530-531
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Recent camera developments for TEM
Ingo Daberkow, Bernhard Feja, Matthias Stumpf, Hans R. Tietz
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05 September 2003, pp. 532-533
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Practical Applications of the Fourier Transformation in Electron Microscopy (Part 2)
Bernd Kraus
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05 September 2003, p. 564
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Front matter

MAM volume 9 issue S03 Cover and Front matter
Published online by Cambridge University Press:

04 September 2003, p. f1
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Page 14 of 14

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Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

Non-Invasive Electron Microscopic Rapid Virus Diagnosis of Negative-Stained Urine Samples can be Useful in the Diagnosis and Monitoring of Polyomavirus Infections in Renal Transplant Recipients

Emerging viruses – a challenge to diagnostic Electron Microscopy

Real time SEM imaging of FIB milling processes for extended accuracy in Cross Sectioning and TEM Preparation

Thinning and Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy

Critical Dimension Analysis of Thin (~100 nm) Gold Coatings by SEM and EDS

Improving image storage and access in an integrated microscopy unit: experiences with a commercial image database system

Recent camera developments for TEM

Practical Applications of the Fourier Transformation in Electron Microscopy (Part 2)

Front matter

MAM volume 9 issue S03 Cover and Front matter

Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

Front matter