Microscopy and Microanalysis: Volume 9 - Issue S03

Only show content I have access to (1)

Over 3 years (269)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 9 - Issue S03 - September 2003

Invited Papers

Quantitative 3D-Analyses in SEM: A Review

Contrast Mechanisms in the Scanning Low Energy Electron Microscopy

Aberration correction combined with energy filtering: the SMART spectromicroscopy project

The orientation-dependent growth of epitaxial silicon layers at low temperature

High-Resolution Scanning Electron and Scanning Force Microscopy of the Zeolites EMT, FAU, and the Intergrowth System EMT/FAU

Analysis of Microstructure and Texture of Thin Films by Coupled Use of EBSD and Other Scanning Techniques

Measurement of the Deformation of SPM Tips

A New Atomic Force Microscope for Biomedical Research as an Add-on to Light Microscopy

AFM of resin embedded, high pressure frozen and freeze-substituted biological material

NaCl crystal in the system (KCl – NaCl – H2O) (AFM data)

SEM, EPMA and TXRF characterization of electrochemically modified electrode surfaces

Surface Damages on FIB prepared TEM-Specimens: Possibilities of Avoidance and Removal

Usage of Segmental Ionization Detector in Environmental Conditions

Nanosecond Transmission Electron Microscopy: A New Probe for Laser Pulse-Induced Transient Plasmas

Broad Ion Beam Grid Cutting with Gatan PECS for 3D Scanning Electron Microscopy and Microanalysis of Integrated Circuits and Layered Structures

Advantages of Broad Ion Beam (BIB) Processing Compared with Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids

A Rugged Cathode for Photoelectron and DC Thermionic Operation

Fluctuation Electron Microscopy on a-Ge and Polycrystalline Gold

Time-resolved PEEM of Laser Treated Metal Films

Optimization of Poly-(Methylphenylsilylene) Specimens for Cathodoluminescence Measurement

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 9 - Issue S03 - September 2003

Invited Papers