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Ion-induced Auger Electron Spectroscopy as a Potential Route to Chemical Focused-Ion Beam Tomography

Published online by Cambridge University Press:  27 August 2014

Hamed Parvaneh  and
Robert Hull
Hamed Parvaneh
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
Robert Hull
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 310 - 311
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Grant, J. T. in “Characterization of Metal and Polymer Surfaces”, ed, L. H. Lee, (Academic, N.Y., Vol. 1 (1977) p. 133.Google Scholar
[2] Gallon, T. E.in “Electron and Ion Spectroscopy of Solids”, ed. L. Fiermans, J. Vennik, and W.Dekeyser, (Plenum, N.Y1978). p. 230.Google Scholar
[3] Barat, M., Lichten, W. Phys. Rev. A 6 (1972), p. 211.Google Scholar
[4] Briggs, J. S., Prog, Rep. Phys. 39 (1975). p. 217–289.Google Scholar
[5] Baragiola, R. A. Radiation Effects 61 (1982). P. 47–72.Google Scholar